Hiroyoshi Imadate

Defect observations of Ni/AlGaN/GaN Schottky contacts on Si substrates using scanning internal photoemission microscopy

T. Egawa, K. Shiojima, Y. Yamaoka, 2017 .

Mapping etching induced damages on GaN surfaces using scanning internal photoemission microscopy

K. Shiojima, A. Terano, Hiroyoshi Imadate, 2017 .

Electrical characteristics of n-GaN Schottky contacts on cleaved surfaces of free-standing substrates: Metal work function dependence of Schottky barrier height

Tomoyoshi Mishima, Kenji Shiojima, T. Mishima, 2017 .