Hisafumi Iwata

Precise Visual Inspection Algorithm for LSI Wafer Patterns Using Grayscale Image Comparison

Yasuo Nakagawa, Hitoshi Kubota, Yukio Matsuyama, 1988, MVA.

Prediction of the fatigue fracture of a bolt by ultrasonic flaw detection.

Masaya Hagiwara, Isamu Yoshimoto, Hisafumi Iwata, 1986 .

Particle-Limited Yield Prediction Method

Makoto Ono, Shun'ichi Kaneko, Hisafumi Iwata, 2010 .

In-line wafer inspection data warehouse for automated defect limited yield analysis

Makoto Ono, Hisafumi Iwata, Junko Konishi, 2000, 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072).

Automatic visual inspection system for thin film magnetic head wafer using optical enhancement and image processing techniques

Hitoshi Kubota, Yukio Matsuyama, Hisafumi Iwata, 1993, Optics & Photonics.

Thin Film Magnetic Head Wafer Inspection Technique Using Geometrical Feature Based Image Comparison

Hidehiro Ikeda, Yukihiro Shibata, Hisafumi Iwata, 1998, MVA.

Prediction of the Fatigue Fractue of a Bolt by Ultrasonic Flaw Detection : Vibration, Control Engineering, Engineering for Industry

Masaya Hagiwara, Isamu Yoshimoto, Hisafumi Iwata, 1987 .

Precise Visual Inspection of LSI Wafer Patterns by Local Perturbation Pattern Matching Algorithm

Yasuo Nakagawa, Hitoshi Kubota, Yukio Matsuyama, 1990, Systems and Computers in Japan.

Accuracy of yield impact calculation based on kill ratio

Hisafumi Iwata, M. Ono, K. Watanabe, 2002, 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 (Cat. No.02CH37259).

Visual Inspection System for Thin Film Magnetic Heads Using Optical Enhancement and Gray Scale Image Processing

Hitoshi Kubota, Hidehiro Ikeda, Yukio Matsuyama, 1994 .

Repair yield simulation with iterative critical area analysis for different types of failure

Kazunori Nemoto, Kousuke Okuyama, Shiro Kamohara, 2002, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings..