Anuj Pushkarna

Comparison of performance parameters of SRAM designs in 16nm CMOS and CNTFET technologies

Anuj Pushkarna, Sajna Raghavan, Hamid Mahmoodi, 2010, 23rd IEEE International SOC Conference.

Reliability analysis of power gated SRAM under combined effects of NBTI and PBTI in nano-scale CMOS

Anuj Pushkarna, Hamid Mahmoodi, 2010, GLSVLSI '10.