J.J. Liou

发表

Extraction of the bulk-charge effect parameter in MOSFETs

F.J. Garcia Sanchez, A. Ortiz-Conde, J.A. Salcedo, 2000, 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400).

A Novel and Robust Un-Assisted, Low-Trigger and High-Holding Voltage SCR (uSCR) for Area-Efficient On-Chip ESD Protection

Lifang Lou, J.J. Liou, 2007, 2007 IEEE Conference on Electron Devices and Solid-State Circuits.

An Unassisted, Low Trigger-, and High Holding-Voltage SCR (uSCR) for On-Chip ESD-Protection Applications

Lifang Lou, J.J. Liou, 2007, IEEE Electron Device Letters.

A 20-V CMOS-Based Monolithic Bidirectional Power Switch

J.J. Liou, Y. Fu, X. Cheng, 2007, IEEE Electron Device Letters.

Modeling of On-Chip Differential Inductors and Transformers/Baluns

J.J. Liou, Ji Chen, 2007, IEEE Transactions on Electron Devices.

Effective channel length of submicron MOSFETs: numerical simulation, physical mechanisms, and extraction methods

A. Ortiz-Conde, J.J. Liou, R. Narayanan, 1995, Proceedings of 4th International Conference on Solid-State and IC Technology.

Electrostatic Discharge Robustness of Si Nanowire Field-Effect Transistors

Yoon-Ha Jeong, Wen Liu, J.J. Liou, 2009, IEEE Electron Device Letters.

Parameter extraction using lateral and vertical optimization

F.J. Garcia Sanchez, A. Ortiz-Conde, J.J. Liou, 2000, 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400).

A novel dual-polarity device with symmetrical/asymmetrical S-type I-V characteristics for ESD protection design

J.J. Liou, J.A. Salcedo, 2006, IEEE Electron Device Letters.

On the design of tunable high-holding-voltage LVTSCR-based cells for on-chip ESD protection

J.J. Liou, C. Bernier, J.A. Salcedo, 2004, Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004..

Design and integration of novel SCR-based devices for ESD protection in CMOS/BiCMOS technologies

J.J. Liou, J.A. Salcedo, J.C. Bernier, 2005, IEEE Transactions on Electron Devices.

On the extraction of the effective channel length of MOSFETs

A. Ortiz-Conde, J.J. Liou, Z. Latif, 1997, 1997 21st International Conference on Microelectronics. Proceedings.

Modeling the soil moisture sensor using an automated data acquisition system

J.J. Liou, J.F. Posada, R. Miller, 1991, Conference Record of the 1991 IEEE Industry Applications Society Annual Meeting.

Novel and robust silicon-controlled rectifier (SCR) based devices for on-chip ESD protection

J.J. Liou, J.A. Salcedo, J.C. Bernier, 2004, IEEE Electron Device Letters.

Design and modeling of on-chip electrostatic discharge (ESD) protection structures

J.J. Liou, Xiaofang Gao, 2004, 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716).

On the extraction of the threshold voltage of MOSFETs

A. Ortiz-Conde, J.J. Liou, G. De Mercato, 1997, 1997 21st International Conference on Microelectronics. Proceedings.

Computer-Aided Design Methodology for Electrostatic Discharge (ESD) Protection Applications

Zhiwei Liu, J.J. Liou, J.A. Salcedo, 2006, 2006 International Caribbean Conference on Devices, Circuits and Systems.

Analysis and design of a zero voltage switching dc-to-ac inverter

J.J. Liou, I. Batarseh, A. Khan, 1995, Proceedings of First International Caracas Conference on Devices, Circuits and Systems.

Acomprehensive compact SCR model for CDM ESD circuit simulation

Lifang Lou, J.J. Liou, 2008, 2008 IEEE International Reliability Physics Symposium.

Base-collector junction capacitance of bipolar transistors operating at high current densities

J.J. Liou, J. Liou, 1987, IEEE Transactions on Electron Devices.

A novel SCR for ESD protection in ICs

Yan Han, J.J. Liou, Shurong Dong, 2007, 2007 7th International Conference on ASIC.

SCR device for ESD protection in sub-micron triple well silicided CMOS processes

J.J. Liou, J.A. Salcedo, J.C. Bernier, 2004, Proceedings of the Fifth IEEE International Caracas Conference on Devices, Circuits and Systems, 2004..

On the Reliability Issues of RF CMOS Devices

Hiroshi Iwai, J.J. Liou, Yue Fu, 2006, 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings.

Modeling of mismatch effect in submicron MOSFETs based on BSIM3 model and parametric tests

J.J. Liou, Q. Zhang, J. McMacken, 2001, IEEE Electron Device Letters.

CMOS technology-based spiral inductors for RF applications

J.J. Liou, Ji Chen, 2006, 2006 International Workshop on Nano CMOS.

Improved and physics-based model for symmetrical spiral inductors

J.J. Liou, Ji Chen, J. Liou, 2006, IEEE Transactions on Electron Devices.