W. T. Holman
发表
B. L. Bhuva,
R. Wong,
B. Narasimham,
2014,
2014 IEEE International Reliability Physics Symposium.
L. W. Massengill,
W. T. Holman,
S. E. Armstrong,
2012,
IEEE Transactions on Nuclear Science.
B. L. Bhuva,
B. Narasimham,
L. W. Massengill,
2010,
2010 IEEE International Reliability Physics Symposium.
L. W. Massengill,
W. T. Holman,
S. E. Armstrong,
2011,
2011 12th European Conference on Radiation and Its Effects on Components and Systems.
J. S. Kauppila,
B. L. Bhuva,
L. W. Massengill,
2015,
IEEE Transactions on Nuclear Science.
L. W. Massengill,
B. L. Bhuva,
T. D. Loveless,
2009,
2009 European Conference on Radiation and Its Effects on Components and Systems.
D. R. Ball,
L. W. Massengill,
B. L. Bhuva,
2011,
IEEE Transactions on Nuclear Science.
B. L. Bhuva,
R. Wong,
L. W. Massengill,
2013,
IEEE Transactions on Nuclear Science.
J. S. Kauppila,
L. W. Massengill,
W. T. Holman,
2012,
IEEE Transactions on Nuclear Science.
J. S. Kauppila,
J. A. Maharrey,
M. L. Alles,
2015,
2015 IEEE Radiation Effects Data Workshop (REDW).
L. W. Massengill,
B. Narasimham,
W. T. Holman,
2017,
IEEE Transactions on Nuclear Science.
J. S. Kauppila,
L. W. Massengill,
T. Daniel Loveless,
2013,
IEEE Transactions on Nuclear Science.
B. L. Bhuva,
L. W. Massengill,
T. D. Loveless,
2015,
IEEE Transactions on Nuclear Science.
M. L. Alles,
L. W. Massengill,
B. L. Bhuva,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
L. W. Massengill,
B. L. Bhuva,
W. T. Holman,
2011,
2011 IEEE International Conference on IC Design & Technology.
L. W. Massengill,
B. L. Bhuva,
B. Narasimham,
2011,
IEEE Transactions on Device and Materials Reliability.
Characterization of Single-Event Transients Of Body-Tied vs. floating-body circuits in 150 nm 3D SOI
B. L. Bhuva,
L. W. Massengill,
W. T. Holman,
2011,
2011 12th European Conference on Radiation and Its Effects on Components and Systems.
W. T. Holman,
W. H. Robinson,
peixiong zhao,
2007,
IEEE Transactions on Nuclear Science.
T. D. Loveless,
W. T. Holman,
Y. P. Chen,
2017,
IEEE Transactions on Nuclear Science.
W. T. Holman,
J. Connelly,
1995
.
W. T. Holman,
B L Bhuva,
W T Holman,
2011,
IEEE Transactions on Nuclear Science.
J. S. Kauppila,
L. W. Massengill,
B. L. Bhuva,
2018,
IEEE Transactions on Nuclear Science.
W. T. Holman,
J. A. Connelly,
1994,
Proceedings of 1994 37th Midwest Symposium on Circuits and Systems.
W. T. Holman,
K. G. Lamb,
S. J. Sanchez,
1997,
Proceedings of 40th Midwest Symposium on Circuits and Systems. Dedicated to the Memory of Professor Mac Van Valkenburg.
L. W. Massengill,
B. L. Bhuva,
T. D. Loveless,
2011,
IEEE Transactions on Nuclear Science.
L. W. Massengill,
B. L. Bhuva,
N. Gaspard,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
J. S. Kauppila,
D. R. Ball,
J. A. Maharrey,
2018,
IEEE Transactions on Nuclear Science.
L. W. Massengill,
B. L. Bhuva,
W. T. Holman,
2011,
IEEE Transactions on Nuclear Science.
J. S. Kauppila,
L. W. Massengill,
W. T. Holman,
2011,
IEEE Transactions on Nuclear Science.
Single-Event Upset Characterization of Common First- and Second-Order All-Digital Phase-Locked Loops
T. D. Loveless,
W. T. Holman,
Y. P. Chen,
2017,
IEEE Transactions on Nuclear Science.
W. T. Holman,
J.D. Carothers,
J.J. Rodriguez,
2000,
Proceedings of 13th Annual IEEE International ASIC/SOC Conference (Cat. No.00TH8541).
W. T. Holman,
Srikanth Jagannathan,
Daniel R Herbison,
2010,
IEEE Transactions on Nuclear Science.
J. S. Kauppila,
J. A. Maharrey,
R. C. Harrington,
2018,
IEEE Transactions on Nuclear Science.
B. Narasimham,
W. T. Holman,
V. Ramachandran,
2006,
IEEE Transactions on Device and Materials Reliability.
B. Narasimham,
W. T. Holman,
B.L. Bhuva,
2007,
IEEE Transactions on Nuclear Science.
T. D. Loveless,
W. T. Holman,
B.L. Bhuva,
2007,
IEEE Transactions on Nuclear Science.
W. T. Holman,
J. A. Connelly,
W. T. Holman,
1997
.
W. T. Holman,
B.L. Bhuva,
A.F. Witulski,
2017,
IEEE Transactions on Nuclear Science.
W. T. Holman,
William Timothy Holman,
1994
.
B. Narasimham,
W. T. Holman,
R.A. Reed,
2009,
IEEE Transactions on Device and Materials Reliability.