Jun Yao

Selective Check of Data-Path for Effective Fault Tolerance

Jun Yao, Yuko Hara-Azumi, Yasuhiko Nakashima, 2013, IEICE Trans. Inf. Syst..

Time-Dependent Degradation in Device Characteristics and Countermeasures by Design

Masahiko Yoshimoto, Masanori Hashimoto, Shuhei Tanakamaru, 2018, VLSI Design and Test for Systems Dependability.

A CGRA-Based Approach for Accelerating Convolutional Neural Networks

Jun Yao, Yasuhiko Nakashima, Shinya Takamaeda-Yamazaki, 2015, 2015 IEEE 9th International Symposium on Embedded Multicore/Many-core Systems-on-Chip.

Selective Check of DataPath for E ff ective Fault Tolerance

S. Yamashita, Yuko Hara-Azumi, Y. Nakashima, 2013 .

DARA: A Low-Cost Reliable Architecture Based on Unhardened Devices and Its Case Study of Radiation Stress Test

K. Kobayashi, Y. Nakashima, Jun Yao, 2012, IEEE Transactions on Nuclear Science.

RazorProtector: Maintaining Razor DVS Efficiency in Large IR-Drop Zones by an Adaptive Redundant Data-Path

Takashi Nakada, Jun Yao, Yasuhiko Nakashima, 2012, IEICE Trans. Fundam. Electron. Commun. Comput. Sci..

Introducing OVP awareness to achieve an efficient permanent defect locating

Jun Yao, Yasuhiko Nakashima, Tanvir Ahmed, 2012, 2012 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH).