D. Young
发表
C.-Y. Su,
M. Armstrong,
S. Chugh,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
S. Mudanai,
K. Phoa,
P. Bai,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
Jie Zhou,
C. Vo,
D. Young,
1998,
1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216).