David Y. Lepejian

Can Defect-Tolerant Chips Better Meet the Quality Challenge?

Wojciech Maly, Alex Orailoglu, Michael Nicolaidis, 1996, VTS.

Using Electrical Bitmap Results from Embedded Memory to Enhance Yield

David Y. Lepejian, Alvin Jee, Ben Chu, 2001, IEEE Des. Test Comput..

A D&T Roundtable: Testing Mixed Logic and DRAM Chips

Yervant Zorian, Ian Burgess, T. W. Williams, 1998, IEEE Des. Test Comput..

Tutorial Statement

Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, 2000, DATE.