T. Shibamori

3‐2: Analyzing the Degradation Process of Quantum‐Dot LEDs (QLEDs) by Mass Spectometry

C. Adachi, K. Harada, H. Mo, 2022, SID Symposium Digest of Technical Papers.

Composition depth profile analysis of bulk heterojunction layer by time-of-flight secondary ion mass spectrometry with gradient shaving preparation

Daisuke Kitazawa, Shuhei Yamamoto, J. Tsukamoto, 2010 .

Quantitative Evaluation of Molecular Diffusion in Organic Planar Heterojunctions by Time-of-Flight Secondary Ion Mass Spectroscopy

K. Tajima, Kyohei Nakano, T. Shibamori, 2018, ACS omega.

Analysis of Degradation Related to Layered Structures

T. Tsutsui, H. Ohata, Y. Otsuka, 2021 .

TOF-SIMS characterization of industrial materials: from silicon wafer to polymer

A. Karen, T. Shibamori, N. Man, 2003 .

43‐2: Application of Liquid Extraction Surface Analysis (LESA)‐NanoESI‐Orbitrap‐MS to a Degradation Analysis of Organic EL Elements

N. Muraki, T. Akiyama, Hirotaka Shioji, 2020 .

19‐3: Examination in Application of TOF‐SIMS with MS/MS to a Degradation Analysis of OLED

T. Miyamoto, Shin-ichi Okamura, J. Sameshima, 2019, SID Symposium Digest of Technical Papers.