K.N. Bhat

Electrical and Reliability Studies of “Wet $ \hbox{N}_{2}\hbox{O}$” Tunnel Oxides Grown on Silicon for Flash Memory Applications

P.N. Babu, G. Govind, S.M.S. Prasad, 2007, IEEE Transactions on Device and Materials Reliability.

The correct equivalent box representation for the buried layer of BC MOSFET's in terms of the implantation parameters

K.N. Bhat, S. Karmalkar, K. N. Bhat, 1987, IEEE Electron Device Letters.

Goals for a basic level IGBT model with easy parameter extraction

K.N. Bhat, P.O. Lauritzen, G.K. Andersen, 2000, COMPEL 2000. 7th Workshop on Computers in Power Electronics. Proceedings (Cat. No.00TH8535).