David P. Brunco

Mechanisms of excimer laser ablation of strongly absorbing systems

Michael O. Thompson, Peter M. Goodwin, C. E. Otis, 1993, Photonics West - Lasers and Applications in Science and Engineering.

Key Issues for the Development of a Ge CMOS Device in an Advanced IC Circuit

Paul Zimmerman, Eddy Simoen, Cedric Huyghebaert, 2006 .

Performance and reliability of HfAlOx-based interpoly dielectrics for floating-gate Flash memory

Dirk Wellekens, J. Van Houdt, L. Haspeslagh, 2008 .

Complete experimental test of kinetic models for rapid alloy solidification

Michael O. Thompson, Paul G. Sanders, David P. Brunco, 2000 .

Germanium MOSFET Devices: Advances in Materials Understanding, Process Development, and Electrical Performance

Geert Hellings, Jerome Mitard, Marc Heyns, 2008 .

Understanding the materials, electrical and reliability impact of Al-addition to ZrO2 for BEOL compatible MIM capacitors

Dirk Utess, Konrad Seidel, David P. Brunco, 2014, Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA).

Ruthenium gate electrodes on SiO2 and HfO2: Sensitivity to hydrogen and oxygen ambients

Luigi Pantisano, Tom Schram, Andre Stesmans, 2006 .

Temperature measurements of polyimide during KrF excimer laser ablation

Michael O. Thompson, C. E. Otis, David P. Brunco, 1992 .

Observation and Suppression of Nickel Germanide Overgrowth on Germanium Substrates with Patterned SiO2 Structures

Marc Meuris, David P. Brunco, Karl Opsomer, 2008 .