M. Hankinson

The development of a digital signal processing and plotting package to support testing of hazardous and radioactive material packages

W. L. Uncapher, J. S. Ludwigsen, M. Arviso, 1995 .

Run-to-run critical dimension and sidewall angle lithography control using the PROLITH simulator

M. Hankinson, J. Freudenberg, C.E. Chemali, 2004, IEEE Transactions on Semiconductor Manufacturing.

Microeconomics of accelerated shrinks in demand-limited markets

G. Falessi, M. Hankinson, A. Levy, 2001, 2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203).