Xavier Garros

发表

M. Rafik, Gilles Reimbold, X. Federspiel, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Maud Vinet, Mikaël Casse, Laurent Brunet, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

Gilles Reimbold, Charles Leroux, Gérard Ghibaudo, 2007, Microelectron. Reliab..

Gilles Reimbold, Olivier Thomas, Adam Makosiej, 2014, IEEE Transactions on Electron Devices.

Maud Vinet, Mikaël Casse, Laurent Brunet, 2017, 2017 47th European Solid-State Device Research Conference (ESSDERC).

A. Torres, Xavier Garros, F. Gaillard, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

M. Rafik, Mikaël Casse, Gilles Reimbold, 2009, Microelectron. Reliab..

Gérard Ghibaudo, C. A. Dimitriadis, Christoforos Theodorou, 2016, 2016 46th European Solid-State Device Research Conference (ESSDERC).

Mikaël Casse, Sylvain Barraud, X. Federspiel, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Sorin Cristoloveanu, M. Rafik, Gilles Reimbold, 2015, 2015 IEEE International Reliability Physics Symposium.

M. Rafik, X. Federspiel, Xavier Garros, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Sorin Cristoloveanu, Maryline Bawedin, François Andrieu, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

Sorin Cristoloveanu, Gilles Reimbold, François Andrieu, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

Gilles Reimbold, X. Federspiel, Alexandre Subirats, 2018, Microelectron. Reliab..

Florian Cacho, Xavier Garros, David Roy, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

Cyrille Le Royer, Romain Gwoziecki, Gérard Ghibaudo, 2021, ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC).

Mikaël Casse, Philippe Ferrari, Claire Fenouillet-Béranger, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).

L. Gerrer, Florian Cacho, D. Roy, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).

Gilles Reimbold, Gerard Ghibaudo, Emmanuel Vincent, 2015, IEEE Transactions on Electron Devices.

Thomas Skotnicki, Sorin Cristoloveanu, Simon Deleonibus, 2003, 2003 8th International Symposium Plasma- and Process-Induced Damage..

G. Ghibaudo, Gilles Reimbold, Xavier Garros, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).