M. Berger

Spectroscopic ellipsometry with compensator and X-ray specular reflectivity for characterization of thin optical layers on transparent substrates

F. Bertin, A. Chabli, G. Ravel, 1998 .

The orientation of the magnetization of thin films as determined by the Hall effect

A. Palumbo, B. Brandt, D. Stinson, 1987 .

Near-UV to IR optical characterization of YF3 thin films deposited by evaporation and ion beam processes

Etienne Quesnel, M. Berger, J. Cigna, 1996, Optical Systems Design.