T. Boudet

Spectroscopic ellipsometry with compensator and X-ray specular reflectivity for characterization of thin optical layers on transparent substrates

F. Bertin, A. Chabli, G. Ravel, 1998 .

Modeling ion exchange in glass with concentration-dependent diffusion coefficients and mobilities

Michel Levy, Dominique Persegol, Alexandru I. Lupascu, 1996 .