J. Shepherd

Near-field injection at die level

A. Boyer, B. Vrignon, J. Shepherd, 2015, 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC).

A pad ICIM model for EMC immunity simulation

Wei Mao, B. Vrignon, J. Shepherd, 2012, 2012 Asia-Pacific Symposium on Electromagnetic Compatibility.

On-chip sampling and EMC modeling of I/Os switching to evaluate conducted RF disturbances propagation

S. Ben Dhia, B. Vrignon, J. Shepherd, 2010, 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility.

Evaluation of the near-field injection method at integrated circuit level

A. Boyer, B. Vrignon, J. Shepherd, 2014, 2014 International Symposium on Electromagnetic Compatibility.

Automatic verification of EMC immunity by simulation

Jianfei Wu, B. Vrignon, J. Shepherd, 2013, 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo).

Near-field scan - State of the art and standardisation

C. Marot, B. Vrignon, J. Shepherd, 2012, 2012 Asia-Pacific Symposium on Electromagnetic Compatibility.