Gerard Morin
发表
Olivier Moreau,
Yves Bertrand,
Thierry Paillat,
2013,
IEEE Transactions on Industry Applications.
Low cost wafer level parallel test strategy for reliability assessments in sub-32nm technology nodes
Gerard Morin,
Mustapha Rafik,
Francois Dieudonne,
2011,
2011 IEEE ICMTS International Conference on Microelectronic Test Structures.
Gerard Morin,
Olivier Roux dit Buisson,
1996,
ESSDERC '96: Proceedings of the 26th European Solid State Device Research Conference.