P. O'Sullivan
发表
Alan Mathewson,
S. Minehane,
S. Healy,
1997
.
P. O'Sullivan,
1986
.
A. Concannon,
Alan Mathewson,
P. O'Sullivan,
2001
.
A. Mathewson,
P. O'Sullivan,
A. Meehan,
1994,
Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS).
Effect of Polysilicon Doping and Oxidation Conditions on Tunnel Oxide Performance For EEPROM Devices
A. Mathewson,
P. O'Sullivan,
F. Naughton,
1993,
ESSDERC '93: 23rd European solid State Device Research Conference.
Alan Mathewson,
S. Minehane,
P. O'Sullivan,
2000
.
A. Mathewson,
P. O'Sullivan,
S. Minehane,
2000,
30th European Solid-State Device Research Conference.
A. Mathewson,
P. O'Sullivan,
A. Martin,
1996,
1996 International Integrated Reliability Workshop Final Report.
A. Mathewson,
P. Chaparala,
P. O'Sullivan,
1996,
Proceedings of International Reliability Physics Symposium.
A. Concannon,
A. Mathewson,
P. O'Sullivan,
1998,
28th European Solid-State Device Research Conference.
Investigation of reliability measurements with ramped and constant voltage stress on MOS gate oxides
Alan Mathewson,
P. O'Sullivan,
A. Martin,
1996
.
A. Mathewson,
P. O'Sullivan,
A. Mathewson,
1994,
Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS).
Alan Mathewson,
Gerard Ghibaudo,
G. Pananakakis,
2001
.
A. Mathewson,
P. Chaparala,
P. O'Sullivan,
1995,
IEEE 1995 International Integrated Reliability Workshop. Final Report.
A. Mathewson,
S. Minehane,
S. Healy,
1997,
Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Alan Mathewson,
Prasad Chaparala,
John S. Suehle,
1997
.
Alan Mathewson,
P. O'Sullivan,
A. Mathewson,
1997
.
Alan Mathewson,
P. O'Sullivan,
A. Martin,
1996
.
A. Mathewson,
S. Minehane,
P. O'Sullivan,
1999,
29th European Solid-State Device Research Conference.
A. Mathewson,
P. O'Sullivan,
F. Pio,
1991,
ESSDERC '91: 21st European Solid State Device Research Conference.