E. Suvorov

发表

X-ray diffraction in a uniformly bent crystal in reflection geometry

E. Shulakov, I. Smirnova, É. Suvorov, 2011 .

Section Topography as Single-Crystal Interferometry

V. Kaganer, V. Nikitenko, V. Indenbom, 1978, March 16.

Investigation of image formation of straight‐line dislocations in the case of extinction contrast

V. I. Polovinkina, V. Nikitenko, V. Indenbom, 1974 .

X-Ray Topography: Yesterday, Today, and Prospects for the Future

É. Suvorov, E. Suvorov, 2018, Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques.

X-ray diffraction imaging of defects in topography (microscopy) studies

I. Smirnova, É. Suvorov, E. Suvorov, 2015 .

Features of X-ray diffraction at elastic deformations near the dislocation axis in section topography techniques

E. Shulakov, I. Smirnova, É. Suvorov, 2007 .

Plane‐wave X‐ray images of dislocations parallel to the diffraction vector

V. Kaganer, V. Indenbom, É. Suvorov, 1984 .

Dislocation Contrast in the Case of Anomalous X-Ray Transmission

I. Rusakova, V. Indenbom, E. Suvorov, 1980, July 16.

On the possiblities of X-ray dynamic focussing to study dislocation microstress fields

K. Mukhin, V. Nikitenko, É. Suvorov, 1978 .

X-ray Diffraction Tomography Using Laboratory Sources for Studying Single Dislocations in a Low Absorbing Silicon Single Crystal

F. Chukhovskii, V. Asadchikov, A. Buzmakov, 2019, Optoelectronics, Instrumentation and Data Processing.

X-ray Diffraction Tomography Using Laboratory Sources for Studying Single Dislocations in a Low Absorbing Silicon Single Crystal

F. Chukhovskii, V. Asadchikov, A. Buzmakov, 2019, Optoelectronics, Instrumentation and Data Processing.

X-ray topo-tomography studies of linear dislocations in silicon single crystals

A. Danilewsky, F. Chukhovskii, T. Baumbach, 2018, Journal of Applied Crystallography.

Features of the Formation of Bending Interference Bands on X-Ray Section Topograms in the Bragg Geometry

I. Smirnova, E. Suvorov, 2021, Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques.

Unusual X-Shaped Defects in the Silicon Single Crystal Subjected to Four-Point Bending

D. A. Zolotov, V. Asadchikov, A. Buzmakov, 2021, JETP Letters.

A new approach to understanding the mechanisms of diffraction imaging of dislocations in X-ray topography

I. Smirnova, É. Suvorov, E. Suvorov, 2012 .

Diffraction image of screw dislocations in X-ray section topography methods

I. Smirnova, E. Suvorov, 2011 .

On the nature of the direct image of defects in diffraction methods of X-ray topography

I. Smirnova, É. Suvorov, E. Suvorov, 2010 .

Interbranch scattering of an X-ray wave field in a strongly distorted region of the elastic field around a dislocation

I. Smirnova, É. Suvorov, E. Suvorov, 2010 .

The outlook for X-ray diffraction topography

I. L. Shulpina, É. Suvorov, E. Suvorov, 2010 .

A new high-sensitivity X-ray diffraction technique for determining local deformations of a crystal surface using “bending interference fringes”

I. Smirnova, E. Suvorov, 2016 .

A device for bending crystals in the process of an X-ray experiment

I. Smirnova, É. Suvorov, A. S. Obrazova, 2015 .

Formation of the image of an edge dislocation in an absorbing crystal

E. Shulakov, I. Smirnova, É. Suvorov, 2007 .