W. Lo

Degradation of ZrN films at high temperature under controlled atmosphere

F. Lu, W. Lo, 2003 .

Microstructure evolution of ZrN films annealed in vacuum

F. Lu, W. Lo, Y. Chieh, 2006 .

Development of Highly Manufacturable, Reliable, and Energy-Efficient Spin-Orbit Torque Magnetic Random Access Memory (SOT-MRAM)

S. Z. Rahaman, Y. See, Y. Hsin, 2022, 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).