Alexander Eifert

发表

Focused ion beam (FIB)-induced changes in the electrochemical behavior of boron-doped diamond (BDD) electrodes

B. Mizaikoff, C. Kranz, A. Eifert, 2014 .

In Situ Monitoring of Pit Nucleation and Growth at an Iron Passive Oxide Layer by using Combined Atomic Force and Scanning Electrochemical Microscopy

Ricardo M. Souto, C. Kranz, J. Izquierdo, 2015 .

In situ investigation of copper corrosion in acidic chloride solution using atomic force-scanning electrochemical microscopy

Ricardo M. Souto, C. Kranz, A. Eifert, 2017 .

SIMULTANEOUS ATOMIC FORCE—SCANNING ELECTROCHEMICAL MICROSCOPY (AFM-SECM) IMAGING OF COPPER DISSOLUTION

Ricardo M. Souto, C. Kranz, A. Eifert, 2016 .

Hyphenating atomic force microscopy.

C. Kranz, A. Eifert, Alexander Eifert, 2014, Analytical chemistry.

Advanced fabrication process for combined atomic force-scanning electrochemical microscopy (AFM-SECM) probes.

B. Mizaikoff, C. Kranz, A. Eifert, 2015, Micron.

Atomic force microscopy probes with integrated boron doped diamond electrodes: Fabrication and application

B. Mizaikoff, C. Kranz, A. Eifert, 2012 .

Inscribing wettability gradients onto polymer substrates with different stiffness using corona discharge in point-to-plane geometry

S. Hardt, T. Baier, E. Bonaccurso, 2015 .

Simple Fabrication of Robust Water‐Repellent Surfaces with Low Contact‐Angle Hysteresis Based on Impregnation

S. Hardt, A. Eifert, T. Baier, 2014 .

Macroscopic and microscopic electrochemical investigation of Clostridium botulinum C2IIa embedded in supported lipid membranes

B. Mizaikoff, C. Kranz, A. Eifert, 2016 .