R. Lowe

Modeling and reliability characterization of area-array electronics subjected to high-g mechanical shock up to 50,000g

P. Lall, J. Blanche, K. Patel, 2012, 2012 IEEE 62nd Electronic Components and Technology Conference.

Leading indicators for prognostic health management of electrical connectors subjected to random vibration

P. Lall, K. Goebel, R. Lowe, 2012, 13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems.

Low carbon buildings: theory and practice

R. Lowe, T. Oreszczyn, 2008 .

Cost assessment for implementation of embedded prognostic health management for electronic systems

P. Lall, K. Goebel, R. Lowe, 2012, 13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems.