Rafael Morales

Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network

Francisco López de la Rosa, A. Fernández-Caballero, Roberto Sánchez-Reolid, 2022, Expert Syst. Appl..

A deep residual neural network for semiconductor defect classification in imbalanced scanning electron microscope datasets

Francisco López de la Rosa, A. Fernández-Caballero, Roberto Sánchez-Reolid, 2022, Appl. Soft Comput..

A Review on Machine and Deep Learning for Semiconductor Defect Classification in Scanning Electron Microscope Images

A. Fernández-Caballero, Roberto Sánchez-Reolid, Francisc López de la Rosa, 2021, Applied Sciences.

Optimal Feature Selection for Defect Classification in Semiconductor Wafers

A. Fernández-Caballero, Roberto Sánchez-Reolid, José L. Gómez-Sirvent, 2022, IEEE Transactions on Semiconductor Manufacturing.

Defect classification on semiconductor wafers using Fisher vector and visual vocabularies coding

A. Fernández-Caballero, Roberto Sánchez-Reolid, Francisc López de la Rosa, 2022, Measurement.

Detection of Unknown Defects in Semiconductor Materials from a Hybrid Deep and Machine Learning Approach

Francisco López de la Rosa, A. Fernández-Caballero, José L. Gómez-Sirvent, 2022, IWINAC.

Vision-Based Human Posture Detection from a Virtual Home-Care Unmanned Aerial Vehicle

Lidia M. Belmonte, A. Fernández-Caballero, P. González, 2022, IWINAC.

Defect detection and classification on semiconductor wafers using two-stage geometric transformation-based data augmentation and SqueezeNet lightweight convolutional neural network

Francisco López de la Rosa, A. Fernández-Caballero, Roberto Sánchez-Reolid, 2023, Comput. Ind. Eng..

ARTIFICIAL INTELLIGENCE TRAINING OF FUTURE INDUSTRY 4.0 ENGINEERS USING LEGO MINDSTORMS IN FINAL DEGREE PROJECTS: AUTONOMOUS VEHICLE PROTYPE AS CASE STUDY

Arturo S. García, Lidia M. Belmonte, A. Fernández-Caballero, 2023, INTED2023 Proceedings.