Dale E. Newbury

发表

David C. Joy, Patrick Echlin, Eric Lifshin, 1990 .

'Maximum Channel Spectrum': An Intuitive Software Tool for Detecting and Recovering Rare Features in Spectrum Image Datacubes

David S. Bright, Dale E. Newbury, 2004 .

Special Topics in Scanning Electron Microscopy

David C. Joy, Patrick Echlin, Eric Lifshin, 2003 .

Parallel Monte Carlo Simulation Using Desktop Computers

John Henry J. Scott, Dale E. Newbury, Robert L. Myklebust, 2000, Microscopy Today.

Pushing the envelope with SEM/SDD-EDS mapping: X-ray spectrum image mapping in 30 seconds or less, but what are the real limits?

Dale E. Newbury, 2010, Scanning Microscopies.

Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

Michael T. Postek, David C. Joy, Dale E. Newbury, 2011 .

Parallel Monte Carlo Simulation Using Desktop Computers

John Henry J. Scott, Dale E. Newbury, Robert L. Myklebust, 1999 .

Scanning electron microscopy/energy dispersive spectrometry fixedbeam or overscan x-ray microanalysis of particles can miss the real structure: x-ray spectrum image mapping reveals the true nature

Dale E. Newbury, Nicholas W. M. Ritchie, 2013, Defense, Security, and Sensing.

DTSA-II EDS Software

David C. Joy, John Henry J. Scott, Joseph I. Goldstein, 2018 .

'High Resolution' Is Often Sought in SEM Imaging, But Establishing Visibility May Be the Challenge: Always Ask "What Might I Be Missing?"

Dale E. Newbury, 2018 .

ImageJ and Fiji

David C. Joy, John Henry J. Scott, Joseph I. Goldstein, 2018 .

Microanalysis to nanoanalysis: analytical techniques for chemical characterization of micrometer- to nanometer-scale structures

Dale E. Newbury, 1995, Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components.

Basic SEM Imaging

David C. Joy, Patrick Echlin, Eric Lifshin, 1990 .

Solving the micro-to-macro spatial scale problem with milliprobe x-ray fluorescence/x-ray spectrum imaging

Dale E. Newbury, Jeffrey M. Davis, 2009, Scanning Microscopies.

Ion Imaging In Secondary Ion Mass Spectrometry

Dale E. Newbury, 1977, Other Conferences.

Faults and foibles of quantitative scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS)

Dale E. Newbury, Nicholas W. M. Ritchie, 2012, Defense + Commercial Sensing.

Rigorous quantitative elemental microanalysis by scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS) with spectrum processing by NIST DTSA-II

Dale E. Newbury, Nicholas W. M. Ritchie, 2014, Other Conferences.

Characterizing heterogeneous particles with SEM/SDD-EDS mapping and NIST Lispix

David S. Bright, Dale E. Newbury, Nicholas W. M. Ritchie, 2009, Scanning Microscopies.

Electron-excited energy dispersive x-ray spectrometry in the variable pressure scanning electron microscope (EDS/VPSEM): it's not microanalysis anymore!

Dale E. Newbury, Nicholas W. M. Ritchie, 2015, SPIE Scanning Microscopies.

Computer-Aided Imaging and Interpretation

David C. Joy, Patrick Echlin, Joseph I. Goldstein, 1986 .

Is scanning electron microscopy/energy dispersive x-ray spectroscopy (SEM/EDS) quantitative? Effect of specimen shape

Dale E. Newbury, Nicholas W. M. Ritchie, 2011, Defense + Commercial Sensing.

Energy Dispersive Spectrometry

Dale E. Newbury, D. Newbury, 2012 .

Electron channeling patterns in the scanning electron microscope

David C. Joy, David L. Davidson, Dale E. Newbury, 1982 .

Energy Dispersive X-ray Spectrometry in the Scanning Electron Microscope

Dale E. Newbury, D. Newbury, 2004, Microscopy and Microanalysis.

Measurement of Trace Constituents by Electron-Excited X-Ray Microanalysis with Energy-Dispersive Spectrometry

Dale E. Newbury, Nicholas W. M. Ritchie, 2016, Microscopy and Microanalysis.

Milli X-ray fluorescence X-ray spectrum imaging for measuring potassium ion intrusion into concrete samples

Prasada Rao Rangaraju, Dale E. Newbury, Jeffrey M. Davis, 2009 .

Scanning Electron Microscopy and X-Ray Microanalysis

David C. Joy, John Henry J. Scott, Joseph I. Goldstein, 2017 .

High‐resolution, energy‐dispersive microcalorimeter spectrometer for X‐ray microanalysis

John M. Martinis, Kent D. Irwin, Gene C. Hilton, 1997 .

X-Ray Microanalysis in the AEM

David B. Williams, David C. Joy, A. D. Romig, 1990 .

Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy

David B. Williams, David B. Williams, David C. Joy, 1990, Springer US.

High-Energy-Resolution Microcalorimeter Spectrometer for EDS X-Ray Microanalysis | NIST

John M. Martinis, Kent D. Irwin, Gene C. Hilton, 1997 .

Electron-Beam-Specimen Interactions

David C. Joy, Patrick Echlin, Eric Lifshin, 1975 .

Superconducting transition-edge-microcalorimeter X-ray spectrometer with 2eV energy resolution at 1.5keV

John M. Martinis, David A. Rudman, Sae Woo Nam, 2000 .

Digital X-ray compositional mapping with standard map corrections for wavelength dispersive spectrometer defocusing

David S. Bright, Ryna B. Marinenko, Dale E. Newbury, 1987 .

X-Ray Spectrometry in Electron Beam Instruments

David B. Williams, Joseph I. Goldstein, Dale E. Newbury, 2012, Springer US.

X-Ray Microanalysis Case Studies

David C. Joy, John Henry J. Scott, Joseph I. Goldstein, 2018 .

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

David C. Joy, Patrick Echlin, Joseph I. Goldstein, 1986, Springer US.