Jean DaRolt

Are advanced DfT structures sufficient for preventing scan-attacks?

Giorgio Di Natale, Bruno Rouzeyre, Marie-Lise Flottes, 2012, 2012 IEEE 30th VLSI Test Symposium (VTS).

A novel differential scan attack on advanced DFT structures

Giorgio Di Natale, Bruno Rouzeyre, Marie-Lise Flottes, 2013, ACM Trans. Design Autom. Electr. Syst..

Scan attacks on side-channel and fault attack resistant public-key implementations

Giorgio Di Natale, Ingrid Verbauwhede, Bruno Rouzeyre, 2012, Journal of Cryptographic Engineering.

A smart test controller for scan chains in secure circuits

Giorgio Di Natale, Bruno Rouzeyre, Marie-Lise Flottes, 2013, 2013 IEEE 19th International On-Line Testing Symposium (IOLTS).

Secure JTAG Implementation Using Schnorr Protocol

Giorgio Di Natale, Ingrid Verbauwhede, Bruno Rouzeyre, 2013, J. Electron. Test..

Thwarting Scan-Based Attacks on Secure-ICs With On-Chip Comparison

Giorgio Di Natale, Bruno Rouzeyre, Marie-Lise Flottes, 2014, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

New security threats against chips containing scan chain structures

Giorgio Di Natale, Bruno Rouzeyre, Marie-Lise Flottes, 2011, 2011 IEEE International Symposium on Hardware-Oriented Security and Trust.

A New Scan Attack on RSA in Presence of Industrial Countermeasures

Giorgio Di Natale, Ingrid Verbauwhede, Bruno Rouzeyre, 2012, COSADE.

Test Versus Security: Past and Present

Giorgio Di Natale, Ingrid Verbauwhede, Bruno Rouzeyre, 2014, IEEE Transactions on Emerging Topics in Computing.

On-chip test comparison for protecting confidential data in secure ICs

Giorgio Di Natale, Bruno Rouzeyre, Marie-Lise Flottes, 2012, 2012 17th IEEE European Test Symposium (ETS).

A scan-based attack on Elliptic Curve Cryptosystems in presence of industrial Design-for-Testability structures

Giorgio Di Natale, Ingrid Verbauwhede, Bruno Rouzeyre, 2012, 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Scan Attacks and Countermeasures in Presence of Scan Response Compactors

Giorgio Di Natale, Bruno Rouzeyre, Marie-Lise Flottes, 2011, 2011 Sixteenth IEEE European Test Symposium.