H. Ammo

A fully-integrated method for RTN parameter extraction

P. Wambacq, B. Parvais, G. Groeseneken, 2017, 2017 Symposium on VLSI Technology.

Defect-based compact modeling for RTN and BTI variability

B. Parvais, B. Kaczer, D. Verkest, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).

A Complementary BiCMOS Technology for Low Power Wireless Telecommunication Applications

H. Ammo, H. Kikuchi, M. Yano, 1999, 29th European Solid-State Device Research Conference.

Study of 90-nm MOSFET subthreshold hump characteristics using newly developed MOSFET array test structure

H. Ammo, N. Yokoyama, A. Mizumura, 2006, IEEE Transactions on Semiconductor Manufacturing.

Layout optimization of RF CMOS in the 90nm generation by a physics-based model including the multi-finger wiring effect

H. Ammo, N. Yoshikawa, A. Nakamura, 2006, IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2006.

A study of 90nm MOSFET subthreshold hump characteristics using newly developed MOSFET array test structure

H. Ammo, A. Mizumura, N. Yokoyama, 2005, Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005..