D. Zintu

Dual ion beam sputtering vanadium dioxide microbolometers by surface micromachining

D. Zintu, G. Tosone, A. Mercuri, 2002 .

The effects of silicon nitride and silicon oxynitride intermediate layers on the properties of tantalum pentoxide films on silicon: X-ray photoelectron spectroscopy, X-ray reflectivity and capacitance–voltage studies

L. Lozzi, S. Santucci, M. Passacantando, 2003 .

Advanced applications to security of IR smart microbolometers

S. Mengali, C. Corsi, R. Viola, 2007, SPIE Security + Defence.

Chemical Warfare Agents Analyzer Based on Low Cost, Room Temperature, and Infrared Microbolometer Smart Sensors

Sandro Mengali, Domenico Luciani, Nicola Liberatore, 2012 .