Isamu Nashiyama

Correlation between proton and heavy-ion SEUs in commercial memory devices

Hiroyuki Shindo, Kenji Sugimoto, K. Chiba, 2003, 2003 IEEE Radiation Effects Data Workshop.

Evaluation of single-event upset tolerance on recent commercial memory ICS

Isamu Nashiyama, Sumio Matsuda, Hisayoshi Itoh, 1997 .