Beomjong Kim

Pressure Dependence on the Electrical Properties of SiO 2 Gate Oxide Formed by Inductive Coupled Plasma Oxidation

C. Chung, S. Nam, Dongchan Kim, 2011 .

Effects of the flux-controlled cation off-stoichiometry in SrRuO3 grown by molecular beam epitaxy on its physical and electrical properties

Yongsung Kim, E. Yoon, Myoungho Jeong, 2020 .