Vitor A. P. Aguiar

Fast and low-cost soft error testing of a COTS microcontroller with alpha particle source

Felipe G. H. Leite, Vitor A. P. Aguiar, Nemitala Added, 2017, 2017 IEEE Radiation Effects Data Workshop (REDW).

Lockstep Dual-Core ARM A9: Implementation and Resilience Analysis Under Heavy Ion-Induced Soft Errors

Fernanda Lima Kastensmidt, Gennaro Severino Rodrigues, Vitor A. P. Aguiar, 2018, IEEE Transactions on Nuclear Science.

X-Ray-Induced Upsets in a Xilinx Spartan 3E FPGA

Fabian Vargas, Felipe G. H. Leite, Vitor A. P. Aguiar, 2015, 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Analyzing the influence of the angles of incidence on SEU and MBU events induced by low LET heavy ions in a 28-nm SRAM-based FPGA

Fernanda Lima Kastensmidt, Jorge Tonfat, Guillaume Hubert, 2016, 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Analyzing Reliability and Performance Trade-Offs of HLS-Based Designs in SRAM-Based FPGAs Under Soft Errors

Fernanda Lima Kastensmidt, Jorge Tonfat, Fernando Aguirre, 2017, IEEE Transactions on Nuclear Science.

Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects

Lucas A. Tambara, Fabio Benevenuti, Fernanda L. Kastensmidt, 2020, IEEE Transactions on Nuclear Science.

Heavy Ions Induced Single Event Upsets Testing of the 28 nm Xilinx Zynq-7000 All Programmable SoC

Fernanda Lima Kastensmidt, Lucas Antunes Tambara, Fernando Aguirre, 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).

Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs

Paolo Rech, Fernanda Lima Kastensmidt, Lucas Antunes Tambara, 2018, IEEE Transactions on Nuclear Science.

Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA

Fabio Benevenuti, Fernanda L. Kastensmidt, Vitor A. P. Aguiar, 2019, IEEE Transactions on Nuclear Science.

Analyzing the Influence of the Angles of Incidence and Rotation on MBU Events Induced by Low LET Heavy Ions in a 28-nm SRAM-Based FPGA

Fernanda Lima Kastensmidt, Jorge Tonfat, Guillaume Hubert, 2017, IEEE Transactions on Nuclear Science.