Nemitala Added

发表

Fast and low-cost soft error testing of a COTS microcontroller with alpha particle source

Felipe G. H. Leite, Vitor A. P. Aguiar, Nemitala Added, 2017, 2017 IEEE Radiation Effects Data Workshop (REDW).

Lockstep Dual-Core ARM A9: Implementation and Resilience Analysis Under Heavy Ion-Induced Soft Errors

Fernanda Lima Kastensmidt, Gennaro Severino Rodrigues, Vitor A. P. Aguiar, 2018, IEEE Transactions on Nuclear Science.

MultiSIMNRA, a computational tool for reliable RBS-FRS depth profile analysis

L. R. P. Kassab, Nemitala Added, C. L. Rodrigues, 2016 .

X-Ray-Induced Upsets in a Xilinx Spartan 3E FPGA

Fabian Vargas, Felipe G. H. Leite, Vitor A. P. Aguiar, 2015, 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Analyzing the influence of the angles of incidence on SEU and MBU events induced by low LET heavy ions in a 28-nm SRAM-based FPGA

Fernanda Lima Kastensmidt, Jorge Tonfat, Guillaume Hubert, 2016, 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Analysis of single-event upsets in a Microsemi ProAsic3E FPGA

Fabian Vargas, Eduardo Augusto Bezerra, Paulo Ricardo Cechelero Villa, 2017, 2017 18th IEEE Latin American Test Symposium (LATS).

Ionizing radiation effects on a COTS low-cost RISC microcontroller

Fabian Vargas, Fernando Aguirre, Felipe G. H. Leite, 2016, 2017 18th IEEE Latin American Test Symposium (LATS).

Ionizing radiation effects on a COTS low-cost RISC microcontroller

Fabian Vargas, Renato Giacomini, Fernando Aguirre, 2016 .

Analysis of SRAM-Based FPGA SEU Sensitivity to Combined Effects of Conducted EMI and TID

Fabian Vargas, Fernando Aguirre, Nemitala Added, 2015, 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Analyzing Reliability and Performance Trade-Offs of HLS-Based Designs in SRAM-Based FPGAs Under Soft Errors

Fernanda Lima Kastensmidt, Jorge Tonfat, Fernando Aguirre, 2017, IEEE Transactions on Nuclear Science.

Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits

Cesar Marcon, Fabian Vargas, Nemitala Added, 2019 .

Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications

Gustavo F. Trindade, Fernando Aguirre, Nemitala Added, 2018 .

Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects

Lucas A. Tambara, Fabio Benevenuti, Fernanda L. Kastensmidt, 2020, IEEE Transactions on Nuclear Science.

Analysis of conducted-EMI noise influence on the effectiveness of an EDAC technique to mitigate soft errors in ionizing radiation environment

Fabian Vargas, Nemitala Added, Nilberto H. Medina, 2018, 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC).

Analysis of COTS FPGA SEU-sensitivity to combined effects of conducted-EMI and TID

Fabian Vargas, Fernando Aguirre, Nemitala Added, 2017, 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo).

Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques

Eduardo Chielle, Ricardo Reis, Jorge Tonfat, 2016, IEEE Transactions on Nuclear Science.

Heavy Ions Induced Single Event Upsets Testing of the 28 nm Xilinx Zynq-7000 All Programmable SoC

Fernanda Lima Kastensmidt, Lucas Antunes Tambara, Fernando Aguirre, 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).

Analysis of FPGA SEU sensitivity to combined effects of conducted EMI and TID

Fabian Vargas, Fernando Aguirre, Nemitala Added, 2016, 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC).

Dynamic heavy ions SEE testing of NanoXplore radiation hardened SRAM-based FPGA: Reliability-performance analysis

Fernanda Lima Kastensmidt, Gennaro S. Rodrigues, Fabio Benevenuti, 2019 .

Reliability–Performance Analysis of Hardware and Software Co-Designs in SRAM-Based APSoCs

Paolo Rech, Fernanda Lima Kastensmidt, Lucas Antunes Tambara, 2018, IEEE Transactions on Nuclear Science.

A New Test Environment Approach to SEE Detection in MOSFETs

Salvador Pinillos Gimenez, Nemitala Added, Nilberto H. Medina, 2015 .

Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA

Fabio Benevenuti, Fernanda L. Kastensmidt, Vitor A. P. Aguiar, 2019, IEEE Transactions on Nuclear Science.

Robust Convolutional Neural Networks in SRAM-based FPGAs: a Case Study in Image Classification

Fernanda Lima Kastensmidt, Fabio Benevenuti, Nemitala Added, 2021, Journal of Integrated Circuits and Systems.

Reliability Evaluation of Voters for Fault Tolerant Approximate Systems

Paulo F. Butzen, Rafael B. Schvittz, Tiago R. Balen, 2021, 2021 IEEE 22nd Latin American Test Symposium (LATS).

External-PIXE analysis for the study of pigments from a painting from the Museum of Contemporary Art

Gustavo F. Trindade, Nemitala Added, P.H.O.V. Campos, 2014 .

Radiation interaction with DNA

Airton Deppman, Nemitala Added, Vito R. Vanin, 2004 .

A Commercial off-the-shelf pMOS Transistor as X-ray and Heavy Ion Detector

L. E. Seixas, Felipe G. H. Leite, Nemitala Added, 2015 .

Upgraded phase control system for superconducting low-velocity accelerating structures

Nemitala Added, K. W. Shepard, B. E. Clifft, 1992 .

The Star Experiment at the Relativistic Heavy-Ion Collider

James S. Harris, Wojciech Dominik, O. A. Grachov, 1994 .

Experimental setup for Single Event Effects at the São Paulo 8UD Pelletron Accelerator

L. E. Seixas, Fernando Aguirre, Nemitala Added, 2014 .

Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects

Fabian Vargas, Jose Lipovetzky, Fernando Aguirre, 2016, IEEE Transactions on Nuclear Science.

Analyzing the Influence of the Angles of Incidence and Rotation on MBU Events Induced by Low LET Heavy Ions in a 28-nm SRAM-Based FPGA

Fernanda Lima Kastensmidt, Jorge Tonfat, Guillaume Hubert, 2017, IEEE Transactions on Nuclear Science.