Renato Giacomini

Fast and low-cost soft error testing of a COTS microcontroller with alpha particle source

Felipe G. H. Leite, Vitor A. P. Aguiar, Nemitala Added, 2017, 2017 IEEE Radiation Effects Data Workshop (REDW).

SOI Global-Shutter Sample-and-Hold Circuit for Image Sensors compared to Bulk CMOS and nMOS

Paula Ghedini Der Agopian, Renato Giacomini, Frederico M. Madeira, 2011 .

Trapezoidal Cross-Sectional Influence on FinFET Threshold Voltage and Corner Effects

Joao Antonio Martino, Renato Giacomini, J. Martino, 2008 .

Operation of Lateral SOI PIN Photodiodes with Back-Gate Bias and Intrinsic Length Variation

Denis Flandre, Aryan Afzalian, Renato Giacomini, 2013 .

A Commercial off-the-shelf pMOS Transistor as X-ray and Heavy Ion Detector

L. E. Seixas, Felipe G. H. Leite, Nemitala Added, 2015 .

A simple model for a new SOI MOSFET with asymmetric trapezoidal gate

Joao Antonio Martino, Renato Giacomini, 2003 .

Illuminated to dark ratio improvement in lateral SOI PIN photodiodes at high temperatures

Denis Flandre, Aryan Afzalian, Renato Giacomini, 2014 .

An improved current model for edgeless SOI MOSFETs

Joao Antonio Martino, Renato Giacomini, 2003 .

Modeling Silicon on Insulator MOS Transistors with Nonrectangular-Gate Layouts

Joao Antonio Martino, Renato Giacomini, J. Martino, 2006 .