Farzin Karimi
发表
Fabrizio Lombardi,
Farzin Karimi,
V. Swamy Irrinki,
2001,
Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing.
Fabrizio Lombardi,
Wenyi Feng,
Farzin Karimi,
2001,
IEEE Micro.
Fabrizio Lombardi,
Waleed Meleis,
Zainalabedin Navabi,
2002,
17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings..
Farzin Karimi,
F. Karimi,
2008,
2008 IEEE International High Level Design Validation and Test Workshop.
Fabrizio Lombardi,
Farzin Karimi,
2001,
Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.
Fabrizio Lombardi,
Fred J. Meyer,
Farzin Karimi,
2002,
Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002).
Fabrizio Lombardi,
Farzin Karimi,
2002,
Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002).
Fabrizio Lombardi,
Nohpill Park,
Farzin Karimi,
2003,
Microelectron. J..
Fabrizio Lombardi,
Farzin Karimi,
2002,
Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002).
Fabrizio Lombardi,
Waleed Meleis,
Zainalabedin Navabi,
2004,
IEEE Transactions on Instrumentation and Measurement.
Fabrizio Lombardi,
Fred J. Meyer,
Hamidreza Hashempour,
2003,
International Test Conference, 2003. Proceedings. ITC 2003..