Hak Kim

Radiation Effects of Commercial Resistive Random Access Memories

Kenneth A. LaBel, Nicolas Roche, Melanie D. Berg, 2014 .

Evaluation of the Radiation Susceptibility of a 3D NAND Flash Memory

Edward P. Wilcox, Kenneth A. LaBel, Raymond L. Ladbury, 2017 .

Functional Interrupts and Destructive Failures from Single Event Effect Testing of Point-Of-Load Devices

Kenneth A. LaBel, Dakai Chen, Hak Kim, 2013 .

Development of a Low-Cost and High-speed Single Event Effects Testers based on Reconfigurable Field Programmable Gate Arrays (FPGA)

M. Friendlich, Hak Kim, J. W. Howard, 2006 .

Single Event Transients in Voltage Regulators for FPGA Power Supply Applications

Kenneth A. LaBel, C. Poivey, A. B. Sanders, 2006 .

Implications of single event effect characterization of hybrid DC-DC converters and a solid state power controller

Kenneth A. LaBel, K. Castell, R. K. Barry, 1995 .

Development of a test methodology for single-event transients (SETs) in linear devices

K. A. LaBel, J. W. Howard, C. Poivey, 2001 .