Abhijit Biswas

发表

Prospects for Improvement of Interplanetary Laser Communication Data Rates by 30 dB

Don M. Boroson, Hamid Hemmati, Abhijit Biswas, 2007, Proceedings of the IEEE.

Temperature dependent model for threshold voltage and subthreshold slope of strained-Si channel MOSFETs with a polysilicon gate

Abhijit Biswas, Swagata Bhattacherjee, A. Biswas, 2014, Microelectron. Reliab..

Effects of asymmetric underlap spacers on nanoscale junctionless transistors and design of optimised CMOS amplifiers

Debapriya Roy, Abhijit Biswas, 2019, IET Circuits Devices Syst..

Ground detectors for optical communications from deep space

Meera Srinivasan, William H. Farr, Abhijit Biswas, 2002, SPIE LASE.

Performance analysis of long Ge channel double gate (DG) p MOSFETs with high-k gate dielectrics based on carrier concentration formulation

Abhijit Biswas, Swagata Bhattacherjee, 2011, Microelectron. Reliab..

Investigations on electrical characteristics and reliability properties of MOS capacitors using HfAlOx on n-GaAs substrates

Abhijit Biswas, P. S. Das, A. Biswas, 2012, Microelectron. Reliab..

Accurate modeling of the influence of back gate bias and interface roughness on the threshold voltage of nanoscale DG MOSFETs

Abhijit Biswas, Swagata Bhattacherjee, 2013, Microelectron. Reliab..

Affordable Wideband Sensor Coupled Vibrotactile Actuator Systems for Psychophysical Experiments

Mandayam A. Srinivasan, Manivannan Muniyandi, Abhijit Biswas, 2016, EuroHaptics.

Deep-Space Optical Communications: Future Perspectives and Applications

Ivan B. Djordjevic, Hamid Hemmati, Abhijit Biswas, 2011, Proceedings of the IEEE.

Palomar Receive Terminal (PRT) for the Mars Laser Communication Demonstration (MLCD) Project

William T. Roberts, Andrew Gray, Jon Hamkins, 2007, Proceedings of the IEEE.

Design of the optoelectronic receiver for deep-space optical communications

John V. Sandusky, Abhijit Biswas, Gerardo G. Ortiz, 2000, LASE.

Role of grooving angle of 14-nm-InAs channel quantum well MOSFETs in improving analogue/RF and linearity performance

Chandrima Mondal, Abhijit Biswas, Sumedha Dasgupta, 2019, IET Circuits Devices Syst..

Charge trapping and reliability characteristics of ultra-thin HfYOx films on n-GaAs substrates

Abhijit Biswas, P. S. Das, 2010, Microelectronics Reliability.