Jing Li

Optical and recording properties of short wavelength optical storage materials

Fuxi Gan, Jing Li, Guangbin Wang, 2000 .

Effects of thermal treatment on the optical constants of GeTe, Sb2Te3, Ge2Sb2Te5 systems

Fuxi Gan, Hao Ruan, Quan Xie, 2001, International Workshop on Information Data Storage and International Symposium on Optical Storage.

Determination of optical parameters of GeTe semiconductor films after thermal treatment

F. Gan, Q. Xie, H. Ruan, 2000 .

Comparison and analysis on measurement of optical parameters of some semiconductor films by two methods

Fuxi Gan, Jing Li, F. Gan, 1999, Optics & Photonics.