I. H. Lee

Influence of post-manufacturing residual mechanical stress and crosslinking by-products on dielectric strength of HV extruded cables

É. David, N. Amyot, S. Y. Lee, 2002 .

The influence of mechanical stresses an the local dielectric strength of HV extruded cables

É. David, N. Amyot, S. Y. Lee, 2000, Conference Record of the 2000 IEEE International Symposium on Electrical Insulation (Cat. No.00CH37075).