A. Houel

Deterministic three-dimensional self-assembly of Si through a rimless and topology-preserving dewetting regime

A. Voigt, I. Berbezier, A. Ronda, 2019, PHYSICAL REVIEW MATERIALS.

Direct patterning of nanostructures by field-induced deposition from a scanning tunneling microscope tip

D. Tonneau, A. Houel, N. Bonnail, 2002 .

Structural and electrical studies of conductive nanowires prepared by focused ion beam induced deposition

D. Tonneau, H. Dallaporta, P. Sudraud, 2008 .

Deterministic 3D self-assembly of Si through a rim-less and topology-preserving dewetting regime

A. Voigt, I. Berbezier, A. Ronda, 2019 .

Proximal Probe Induced Chemical Processing for Nanodevice Elaboration

D. Tonneau, A. Houel, N. Bonnail, 2002 .

Nanoscale multiply charged focused ion beam platform for surface modification, implantation, and analysis.

A. Cassimi, A. Keizer, P. Salou, 2022, The Review of scientific instruments.

A new setup for localized implantation and live-characterization of keV energy multiply charged ions at the nanoscale.

A. Cassimi, I. Monnet, S. Girard, 2016, The Review of scientific instruments.