M. Pauli

Energy dispersive X-ray reflectivity applied to the study of thermal stability of self-assembled organic multilayers: Results on phosphonic acids

Â. Malachias, B. Neves, C. Pérez, 2012 .

A study on WSi2 thin films, formed by the reaction of tungsten with solid or liquid silicon, by rapid thermal annealing

M. Pauli, J. Müller, M. Döscher, 1994 .

Study of roughness evolution and layer stacking faults in short-period atomic layer deposited HfO2/Al2O3 multilayers

O. Schmidt, Y. Mei, Gaoshan Huang, 2011 .

A line beam electron gun for rapid thermal processing

J. Müller, T. Barth, M. Pauli, 1992 .

Comparison of laser and line-electron beam recrystallization of thin polycrystalline silicon films

J. Müller, M. Pauli, G. Dähn, 1992 .

Model-free capacitance analysis of electrodes with a 2D+1D dispersion of time constants

J. Amsden, J. Glass, Yihao Zhou, 2021 .

Large area and rapid thermal zone melting crystallization of silicon films on graphite substrates for photovoltaic use

J. Muller, M. Doscher, M. Pauli, 1993, Conference Record of the Twenty Third IEEE Photovoltaic Specialists Conference - 1993 (Cat. No.93CH3283-9).