Y. Chung

$V_{t}$ Retention Distribution Tail in a Multitime-Program MLC SONOS Memory Due to a Random-Program-Charge-Induced Current-Path Percolation Effect

M. Y. Lee, Chih-Yuan Lu, Tahui Wang, 2012, IEEE Transactions on Electron Devices.

SET/RESET Cycling-Induced Trap Creation and SET-Disturb Failure Time Degradation in a Resistive-Switching Memory

Po-Cheng Su, Wen-Jie Lin, Tahui Wang, 2016, IEEE Transactions on Electron Devices.

Cycling-Induced SET-Disturb Failure Time Degradation in a Resistive Switching Memory

Chih-Yuan Lu, Tahui Wang, Min-Cheng Chen, 2015, IEEE Electron Device Letters.