Yu Wang

发表

Characterizing damage to ONO dielectrics induced during programming SONOS/NROMTM non-volatile semiconductor memory (NVSM) devices

M. White, S. Wrazien, Yu Wang, 2004 .

An analytical retention model for SONOS nonvolatile memory devices in the excess electron state

M. White, Yu Wang, Marvin H. White, 2003, International Semiconductor Device Research Symposium, 2003.

Advancements in nanoelectronic sonos nonvolatile semiconductor memory (NVSM) devices and technology

Yu Wang, Marvin H. White, Stephen J. Wrazien, 2006 .

Characterization of scaled SONOS EEPROM memory devices for space and military systems

Yu Wang, J. Murray, M. White, 2004, Proceedings. 2004 IEEE Computational Systems Bioinformatics Conference.