T. Ferrier

Prolonged 500 °C Operation of 6H-SiC JFET Integrated Circuitry

P. Neudeck, Liang-Yu Chen, G. Beheim, 2009 .

Stable Electrical Operation of 6H–SiC JFETs and ICs for Thousands of Hours at 500 $^{\circ}\hbox{C}$

Liang-Yu Chen, P. Neudeck, G. Beheim, 2008, IEEE Electron Device Letters.

Long-Term Characterization of 6H-SiC Transistor Integrated Circuit Technology Operating at 500 C

Michael J. Krasowski, Roger D. Meredith, Liang-Yu Chen, 2008 .

Electrical Operation of 6H-SiC MESFET at 500 °C for 500 Hours in Air Ambient

Glenn Beheim, David Spry, Liang-Yu Chen, 2004 .