Marco Camalleri

Carrier trapping in thin N2O-grown oxynitride/oxide di-layer for PowerMOSFET devices

Giuseppe Currò, Marco Camalleri, Denise Calì, 2007, Microelectron. Reliab..

Nitrogen bonding configurations near the oxynitride/silicon interface after oxynitridation in N2O ambient of a thin SiO2 gate

Giuseppe Currò, Marco Camalleri, Denise Calì, 2007, Microelectron. Reliab..

Interface states and traps in thin N2O-grown oxynitride/oxide di-layer for PowerMOSFET devices

Giuseppe Currò, Marco Camalleri, Denise Calì, 2007, Microelectron. Reliab..

Si-based resonant cavity light-emitting devices

Alessandro Costa, Maria Eloisa Castagna, Salvatore Coffa, 2004, SPIE OPTO.

Evidence for the precursors of nitrided silicon in the early stages of silicon oxynitridation in N2:N2O atmosphere

Marco Camalleri, L. Renna, G. F. Cerofolini, 2001 .

Strategies for nanoelectronics

Marco Camalleri, L. Renna, D. Mascolo, 2005 .