Siyad C. Ma

Open faults in BiCMOS gates

Edward J. McCluskey, Siyad C. Ma, 1995, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Non-conventional faults in BiCMOS digital circuits

Edward J. McCluskey, Siyad C. Ma, 1992, Proceedings International Test Conference 1992.

Testability features of AMD-K6/sup TM/ microprocessor

Siyad C. Ma, R. Scott Fetherston, Imtiaz P. Shaik, 1997, Proceedings International Test Conference 1997.

Test chip experiments at stanford CRC

Subhasish Mitra, Erik H. Volkerink, Jonathan Chang, 2009 .

An experimental chip to evaluate test techniques experiment results

Edward J. McCluskey, Siyad C. Ma, Piero Franco, 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

Testability Features of the AMD-K6 Microprocessor

Siyad C. Ma, R. Scott Fetherston, Imtiaz P. Shaik, 1998, IEEE Des. Test Comput..

Design-for-Current-Testability (DFCT) for Dynamic CMOS Logic

Edward J. McCluskey, Siyad C. Ma, 1994 .

A comparison of bridging fault simulation methods

Siyad C. Ma, R. Scott Fetherston, Imtiaz P. Shaik, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

Analysis and detection of timing failures in an experimental Test Chip

Edward J. McCluskey, Jonathan Chang, Siyad C. Ma, 1996, Proceedings International Test Conference 1996. Test and Design Validity.

Testing BiCMOS and Dynamic CMOS Logic

Siyad C. Ma, Siyad Ma, 1995 .