A. Touboul
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E. Lorfèvre,
A. Rodriguez,
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2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Electrostatic Mechanisms Responsible for Device Degradation in Proton Irradiated AlGaN/AlN/GaN HEMTs
A. Touboul,
peixiong zhao,
R. Reed,
2008,
IEEE Transactions on Nuclear Science.
L. Dilillo,
F. Wrobel,
F. Saigne,
2015,
2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).