J. Holt

LONG-TERM POTENTIATION IN MEMRISTIVE NEUROMORPHIC SYSTEMS

J. Holt, 2012 .

Comparison of Radiation Effects in Custom and Commercially Fabricated Resistive Memory Devices

M. Marinella, N. Cady, J. Yang-Scharlotta, 2019, IEEE Transactions on Nuclear Science.

The effect of different oxygen exchange layers on TaOx based RRAM devices

N. Cady, Karsten Beckmann, Joshua S. Holt, 2017 .

Integrated sorting and detection of circulating tumor cells in blood using microfluidic cell sorting and surface plasmon resonance

D. Lawrence, N. Cady, A. Mendoza, 2014 .

Nanoscale Hafnium Oxide RRAM Devices Exhibit Pulse Dependent Behavior and Multi-level Resistance Capability

N. Cady, Karsten Beckmann, Joshua S. Holt, 2016 .

Reliability of fully-integrated nanoscale ReRAM/CMOS combinations as a function of on-wafer current control

Karsten Beckmann, Nathaniel C. Cady, Joseph Van Nostrand, 2014, 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW).

The effect of reactive ion etch (RIE) process conditions on ReRAM device performance

Karsten Beckmann, Wilkie Olin-Ammentorp, Nathaniel C. Cady, 2017 .

Effect of Displacement Damage on Tantalum Oxide Resistive Memory

N. Cady, J. Yang-Scharlotta, J. Holt, 2017 .