H. Lochner

The Impact Ionization MOSFET (IMOS) as low-voltage optical detector

B. Schmidt, W. Hansch, I. Eisele, 2010 .

Complexity, quality and robustness - the challenges of tomorrow's automotive electronics

Daniel Hahn, Ulrich Abelein, Helmut Lochner, 2012, 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Effective and combined stressors from multi-dimensional mission profiles for semiconductor reliability

Walter Hansch, A. Alsioufy, T. Lehndorff, 2019, Microelectronics Reliability.