Ying Sun

The past and future of multi-gate field-effect transistors: Process challenges and reliability issues

Rui Zhang, Xiao Yu, Ran Cheng, 2021 .

Phenomenon and Mechanism Investigation of the Cryogenic Random Telegraph Noise for 18 nm FDSOI CMOS

R. Cheng, Bing Chen, Xinze Li, 2022, 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT).