F. Clarke

Gate Current Modeling for Insulating Gate III-N Heterostructure Field-Effect Transistors

M. Shur, G. Simin, M. Khan, 2002 .

Nondestructive determination of free‐electron concentration and mobility in Hg1−xCdxTe, n‐type InSb, and n‐type GaAs

F. Clarke, 1994 .

Faraday rotation analysis of HgCdTe

C. R. Christensen, J. A. Grisham, A. Syllaios, 1993 .

An optical alternative to the hall test

F. Clarke, 1997 .