L. Geng

Microscopic correlation of redshifted luminescence and surface defects in thick InxGa1−xN layers

F. Ponce, J. Christen, F. Bertram, 2002 .

Slip systems and misfit dislocations in InGaN epilayers

Y. Narukawa, F. Ponce, S. Tanaka, 2003 .

Numerical Simulation on the Single-Crystal Grain Structure of GH4169 Superalloy Steel in the Spiral Grain Selector Using Procast Software

Jieyu Zhang, Zheng Chen, Yu Yao, 2019, TMS 2019 148th Annual Meeting & Exhibition Supplemental Proceedings.

Microstructure and electronic properties of InGaN alloys

Fernando Ponce, M. Stevens, M. Stevens, 2003 .

Strain Analysis of InxGa(1-x)N/GaN Films by CBIM Toward Quantification

J. Spence, F. Ponce, B. Jiang, 2003, Microscopy and Microanalysis.

Spatial variation of luminescence of InGaN alloys measured by highly-spatially-resolved scanning cathodoluminescence

Fernando Ponce, Jürgen Christen, F. Ponce, 2002 .

Spatial variation of luminescence of InGaN alloys measured by highly-spatially-resolved scanning catholuminescence

F. Ponce, S. Tanaka, J. Christen, 2001 .

Microstructure of In/sub x/Ga/sub 1-x/N thick epitaxial layers

F. Ponce, R. Liu, B. Jiang, 2003, 2003 International Symposium on Compound Semiconductors.

Surface Morphology of AlxGa1-xN Films Grown by MOCVD

F. Ponce, S. Tanaka, Y. Nakagawa, 2001 .